Since 2021, aggregated from related topics
Scanning probe microscopy is a powerful technique used in materials science, nanotechnology, and biological research to image and manipulate surfaces at the atomic and molecular level. This technique involves using a sharp probe that scans the surface of a sample to measure various properties such as friction, magnetism, conductivity, and topography. Some common types of scanning probe microscopy include atomic force microscopy (AFM) and scanning tunneling microscopy (STM). This technique provides high-resolution images and detailed information about the surface properties of a sample, making it an invaluable tool for studying materials at the nanoscale.